The Comparisson between LBP and SQI Methods in the Surface Roughness Measurement Using ESPI Method

Mohammad Khoirul Effendi, Agus Sigit Pramono, Pandu Pratama, Rifki Wardana

Abstract


Surface roughness measurement using direct contact methods raises several issues, for examples stylus wear and size limitation problems. Furthermore non-contact methods are proposed to solve these problems. One of them is Electronic Speckle Pattern Interferometry (ESPI), which use Helium-Neon (He - Ne) as laser light source. A speckle pattern is produced by scattered light on the surface of the measuring object due to the interference of laser beams, and it will be captured by Charge Coupled Device (CCD) camera. Afterwards Linear Binary Pattern (LBP) and Self Quotient Image (SQI) methods are used to reduce illumination effect in the captured image. The average gray-level from the previous process will be converted into a surface roughness value by gray level to surface roughness conversion formulation. It is obtained from correlation value between gray level and a set of standard roughness. The standard roughness value range is start from 0,05 μm to 12,5 μm. It is measured from five different final machining process, which are flat lapping, grinding, horizontal milling, and vertical milling. As verification, the results of ESPI method will be compared with the result of direct contact tools using Mitutoyo Surftest 301 and 401.

Keywords


Surface Roughness; ESPI; LBP; SQI; FAR; FRR

Full Text:

PDF

References


V Radhakrishan, "Effect of Stylus Radius on The Roughness Values Measured with Tracing Stylus Instruments," Wear, vol. 16, pp. 325–335, 1970.

J I McCool, "Assessing The Effect of Stylus Tip Radius and Flight on Surface Topology Measurements," J. Tribol. Trans. ASME, vol. 106, pp. 202-210, 1984.

C Y Poon and B Bhushan, "Surface Roughness Analysis of Glass-Ceramic Substrates and Finished Magnetic Disks, and Ni-P coated Al-Mg and Glass Substrates," Wear, vol. 190, pp. 89 – 109, 1995.

Rakiman, "Experimental Measuring Study Surface Roughness by Applying Electronic Speckle Pattern Interferometry (ESPI) Method," Institut Teknologi Sepuluh Nopember, Surabaya, Master Thesis 2007.

A Macovski , S D Ramsey, and L F Schaefer , "Time-Lapse Interferometry and Contouring using Television System," Applied Optics, vol. 10, no. 12, pp. 2722-2727, December 1971.

O Schwomma , "Holographisch–interferometrisches oder moiremetrissches verfahren," 298 830, 1972.

N Butters and J A Leeudertz, "Holographic and Video Techniques Applied to Engineering Measurement," Measurement and Control, vol. 4, no. 12, pp. 349-354, December 1971.

Gary Cloud, Optical Methods of Engineering Analysis. New York, USA: Cambridge University Press, 1998.

M Mansono, L Pavesi, L S Oliveira, A Britto, and A Koerich, "Inspection of Metallic Surfaces Using Local Binary Patterns," in IECON 2011 - 37th Annual Conference on IEEE Industrial Electronics Society, Melbourne, 2227 - 2231, p. 2011.

H Yong and Z Chun-Xia, "A Local Binary Pattern Based Methods for Pavement Crack Detection," Journal of Pattern Recognition Research , vol. 5, no. 1, pp. 140-147, 2010.

S Marcel, "On the Recent Use of Local Binary Patterns for Face Authentication," International Journal of Image and Video Processing Special Issue on Facial Image Processing, pp. 1-9, 2007.




DOI: http://dx.doi.org/10.12962/j23378557.v2i1.a470

Refbacks

  • There are currently no refbacks.


Creative Commons License
This work is licensed under a Creative Commons Attribution 4.0 International License.